Patent Overlay mapping: Visualizing Technological Distance

TitlePatent Overlay mapping: Visualizing Technological Distance
Publication TypeJournal Article
Year of PublicationForthcoming
AuthorsKay, L., Youtie J., Newman N., Porter A., & Rafols I.
JournalJournal of the American Society for Information Science and Technology
Volume65
Issue12
Pagination2432-2443
ISBN Number23301635
URLhttp://search.ebscohost.com/login.aspx?direct=true&db=a9h&AN=99454633&site=ehost-live
DOI10.1002/asi.23146
Research Group

Appelbaum IRG 2